BAIK, S.; KIM, W.; LEE, N.; YI, H.; JEONG, Y.; AHN, N. Monte Carlo simulation-based defect ratio estimation approach for a chemical materials stockpile reliability program. Journal of Advances in Military Studies, [S. l.], v. 6, n. 1, p. 1-17, 2023. DOI: 10.37944/jams.v6i1.179. Disponível em: https://journal.idap.re.kr/index.php/JAMS/article/view/179. Acesso em: 18 may. 2024.