Monte Carlo simulation-based defect ratio estimation approach for a chemical materials stockpile reliability program

Authors

  • Seungwon Baik Korea Military Academy, Department of Mechanical and Systems Engineering
  • Wukki Kim Korea Military Academy, Department of Economics and Law
  • Namrye Lee Defense Agency for Technology and Quality
  • Haeyen Yi Defense Agency for Technology and Quality
  • Yongjun Jeong Defense Agency for Technology and Quality
  • Namsu Ahn Korea Military Academy, Department of Mechanical and Systems Engineering

DOI:

https://doi.org/10.37944/jams.v6i1.179

Keywords:

chemical materials stockpile reliability program, KS Q ISO 2859-1, Monte Carlo simulation, Weibull distribution, binomial distribution

Abstract

A chemical material stockpile reliability program (CSRP) that determines the usability, safety, reliability, and performance of chemical equipment and materials is developed to determine the storage or disposal of chemical material stockpile (Storage Chemical Equipment and Material Reliability Evaluation Instruction, 2019). However, current inspection for current CSRP depend on test and evaluation of criteria for level of importance, and so the number of samples and acceptance quality limit (AQL) are presented based on the lot size. All the processes are conducted under KS Q ISO 2859-1, and the defect rate of the entire lot of CSRP items is generally assumed to be a distribution that is similar to a binomial distribution. However, the pass-fail test for CSRP items is based on approximately 10 test items, and the factors that cause defects in these items are also heterogeneous. We propose a new methodology for estimating the defect rates of CSRP items based on Monte Carlo simulations, which are widely used in various academic fields. In addition, we show the future applicability of the methodology by applying it to the K1 gas mask case and revealing the results of the defect rate estimation. We also present future work, including the need for a standard sample of CSRP items.

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Author Biographies

Seungwon Baik, Korea Military Academy, Department of Mechanical and Systems Engineering

(First Author) Korea Military Academy, Department of Mechanical and Systems Engineering, Assistant Professor, [email protected], https://orcid.org/0009-0003-6433-8553.

Wukki Kim, Korea Military Academy, Department of Economics and Law

(Co-Author) Korea Military Academy, Department of Economics and Law, Associate Professor, [email protected], https://orcid.org/0000-0003-1869-0997.

Namrye Lee, Defense Agency for Technology and Quality

(Co-Author) Defense Agency for Technology and Quality, Defense Reliability Research Center, Principal Researcher, [email protected], https://orcid.org/0000-0002-3607-1391.

Haeyen Yi, Defense Agency for Technology and Quality

(Co-Author) Defense Agency for Technology and Quality, Defense Reliability Research Center, Senior Researcher, [email protected], https://orcid.org/0009-0005-4425-9238.

Yongjun Jeong, Defense Agency for Technology and Quality

(Co-Author) Defense Agency for Technology and Quality, Defense Reliability Research Center, Researcher,
[email protected], https://orcid.org/0009-0005-7939-2987.

Namsu Ahn, Korea Military Academy, Department of Mechanical and Systems Engineering

(Corresponding Author) Korea Military Academy, Department of Mechanical and Systems Engineering, Associate Professor, [email protected], https://orcid.org/0000-0003-9251-2565.

References

Baik, S. W., Kim, W. K., Jeong, J. H., Ryu, J. Y., & Ahn, N. S. (2022, Oct 21). Defect Rate Estimation Model for CSRP items using Monte Carlo Simulation. Korean Society for Quay Management Conference in Fall 2022, Pohang, Korea. https://kiss.kstudy.com/Detail/Ar?key=3988115

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Datalabs, & Min, G. H. (2018). Risk Analysis and Decision Making using Monte Carlo Simulations. Anyang, Korea: Eretec

Hong, S. H. & Lee, S. H. (1996). ISO 2859-1(1989), Sampling Plans Indexed by Acceptable Quality Level for Lot-by-Lot Inspection. Journal of Korean Society Quality Management, 24(3), 77-93. http://www.riss.kr/link?id=A75553559

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Kim, S. K., Byun, K. S., Lee, S. Y., Park J. W., & In, C. Y. (2021). A study on the Process Quality Level of K5 Gas Mask. Journal of the Korea Academia-Industrial Cooperation Society, 22(1), 74-80. https://doi.org/10.5762/KAIS.2021.22.1.74

Lai, C. D., Murthy, D. N., & Xie, M. (2006). Weibull distributions and their applications. In Springer Handbooks (pp. 63-78). Springer. https://doi.org/10.1007/978-1-84628-288-1_3

Lee, H. N. (2017). Monte Carlo Simulations and Statistical Analysis. Paju, Korea: Ja-yoo Academy.

K1 gas mask

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Published

2023-04-28

How to Cite

Baik, S., Kim, W., Lee, N., Yi, H., Jeong, Y., & Ahn, N. (2023). Monte Carlo simulation-based defect ratio estimation approach for a chemical materials stockpile reliability program. Journal of Advances in Military Studies, 6(1), 1-17. https://doi.org/10.37944/jams.v6i1.179